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當(dāng)前位置：德國韋氏納米系統(tǒng)有限公司> 供求商機> SR100-Spectroscopic Reflectometer SR100
Spectroscopic reflectometer is our simplest tools among our product lines. By measuring reflection spectra (at normal incidence in most cases), film properties can be modeled with capable TFProbe software. If quick, routine, daily measurements on known films or simple film stack are needed in a low budget case, then SR series are a good choice. If spectra is only of interest, like monitoring antireflection (AR) or high reflection devices' performace, then wavelength range will be most impotant factor in selecting tools. If user needs to determine films' thickness, the optical resolution of spectrometer will also be a factor to consider. We have broad configurations available and system can be customized to meet your specific applications.
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