Helios 5 Laser PFIB System
- 公司名稱 賽默飛世爾科技（中國）有限公司
- 品牌 FEI/賽默飛
- 型號
- 產(chǎn)地
- 廠商性質(zhì) 生產(chǎn)廠家
- 更新時間 2025/1/20 16:33:49
- 訪問次數(shù) 94
聯(lián)系方式：賽默飛世爾科技021-60355786 查看聯(lián)系方式
聯(lián)系我們時請說明是化工儀器網(wǎng)上看到的信息,，謝謝!
欲了解更多信息，請瀏覽公司網(wǎng)站：www.thermofisher.com 賽默飛世爾科技中國簡介賽默飛世爾科技進入中國發(fā)展已超過35年,，在中國的總部設于上海,，并在北京、廣州,、香港,、成都、沈陽,、西安,、南京、武漢,、昆明等地設立了分公司,，員工人數(shù)約為5000名。我們的產(chǎn)品主要包括分析儀器,、實驗室設備,、試劑、耗材和軟件等,，提供實驗室綜合解決方案,，為各行各業(yè)的客戶服務。為了滿足中國市場的需求,，現(xiàn)有7家工廠分別在上海,、北京、蘇州和廣州等地運營,。我們在全國還設立了8個應用開發(fā)中心以及示范實驗室,，將世界級的前沿技術和產(chǎn)品帶給中國客戶，并提供應用開發(fā)與培訓等多項服務,；擁位于上海的中國創(chuàng)新中心,，擁有有100多位專業(yè)研究人員和工程師及70多項專利。創(chuàng)新中心專注于針對垂直市場的產(chǎn)品研究和開發(fā),，結合中國市場的需求和國外先進技術，研發(fā)適合中國的技術和產(chǎn)品,；我們擁有遍布全國的維修服務網(wǎng)點和特別成立的中國技術培訓團隊,，在全國有超過2600名專業(yè)人員直接為客戶提供服務。我們致力于幫助客戶使世界更健康、更清潔,、更安全,。
欲了解更多信息，請登錄網(wǎng)站：www.thermofisher.com 全國服務熱線：021-61621892公司電子郵箱：[email protected]
科學儀器
Helios 5 Laser PFIB System
FIB SEM laser tool for high throughput millimeter scale cross sectioning and 3D characterization with nanometer resolution
The Thermo Scientific Helios 5 Laser PFIB System combines the best-in-class monochromated Elstar Scanning Electron Microscopy (SEM) Column with a plasma focused ion beam (PFIB) and a femtosecond laser to produce a high-resolution imaging and analysis tool with in-situ ablation capability, offering unprecedented material removal rates for fast millimeter-scale characterization at nanometer resolution.
Key Features
Fast material removal
Millimeter-scale cross sections with up to 15,000x faster material removal than a typical gallium focused ion beam.
Accurate and repeatable cut placement
The same coincident point for all 3 beams (SEM/PFIB/laser) enables accurate and repeatable cut placement and 3D characterization.
High throughput processing of challenging materials
Includes non-conductive or ion-beam-sensitive samples.
Shares all capabilities of the Helios 5 PFIB platform
High-quality gallium-free TEM and APT sample preparation and high-resolution imaging capabilities.
Statistically relevant subsurface and 3D data analysis
Acquire data for much larger volumes within a shorter amount of time.
Fast characterization of deep subsurface features
Extraction of subsurface TEM lamella or chunks for 3D analysis.
Fast and easy characterization of air-sensitive samples
No need to transfer samples between different instruments for imaging and cross-sectioning.
Specifications
| Femtosecond-laser specifications | ||
|---|---|---|
| Laser integration |
| |
| Laser Output | ||
| First Harmonic |
| 1030 nm (IR) |
| <280 fs | |
| Second Harmonic |
| 515 nm (green) |
| <300 fs | |
| Optics | ||
| Coincident point |
| |
| Objective lens |
| |
| Polarization |
| |
| Repetition rate |
| |
| Position accuracy |
| |
| Protective shutter |
| |
| Software |
| |
| Safety |
| |
采購中心
化工儀器網(wǎng)